CTB/McGraw-Hill Researcher van der Linden Receives American Educational Research Association E. F. Lindquist Award

CTB/McGraw-Hill announced today that Dr. Wim J van der Linden, Chief Research Scientist at the Company's Monterey, Calif., headquarters, has been awarded the American Educational Research Association (AERA) E. F. Lindquist Award. The annual Lindquist Award honors a distinguished scholar and researcher in recognition of outstanding career achievement in the field of testing and measurement. Dr. van der Linden has served as a respected researcher, scholar, and teacher throughout his career, and his work has resulted in significant advancements in testing and measurement science.

The E. F. Lindquist Award, co-sponsored by AERA and American College Testing (ACT), recognizes research that advances greater understanding and improved use of testing and measurement techniques. Announcement of the award was made at AERA's 2009 Annual Meeting Awards Presentation and Presidential Address, held April 15 at the San Diego Convention Center.

"We are honored that Dr. van der Linden has received the prestigious Lindquist Award," said Dr. Richard J. Patz, CTB/McGraw-Hill vice president of Research and Product Development. "Wim has made stellar contributions to the field of educational measurement and testing throughout his distinguished career. His leadership and innovation are extraordinarily valuable to CTB/McGraw-Hill and to our industry."

Dr. van der Linden is a highly regarded psychometrician, who currently works on the introduction of automated test assembly and adaptive testing at CTB/McGraw-Hill. His wider research interests include test theory, computerized testing, optimal test design, test equating, modeling response times on test items, and decision theory and its application to problems of educational decision making. His publications have appeared in all major international journals, and he is co-editor of two important books on response theory and adaptive testing. His latest book is Linear Models for Optimal Test Design, published by Springer-Verlag in 2005. Dr. van der Linden has served on several journal editorial boards, and has held positions in numerous national and international professional organizations, including president of the Psychometric Society.

About CTB/McGraw-Hill

As the nation's leading publisher of standardized and standards-based achievement tests for pre-school, elementary, middle, high school, and adult education, CTB/McGraw-Hill LLC offers a broad range of assessments, software and services. CTB/McGraw-Hill LLC is part of the Assessment and Reporting group of McGraw-Hill Education (MHE), a division of The McGraw-Hill Companies (NYSE: MHP). MHE is a leading global provider of print and digital instructional, assessment and reference solutions that empower professionals and students of all ages. McGraw-Hill Education has offices in 33 countries and publishes in more than 65 languages. Additional information is available at www.CTB.com.

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